We are seeking an Applications Specialist with strong expertise in Scanning Electron Microscopy (SEM), Focused Ion Beam (FIB), and Transmission Electron Microscopy (TEM) sample preparation. In this role, you will support cutting-edge R&D projects by delivering precise analyses and innovative methodologies that drive product quality and development decisions.

What you will do:

• Operate and maintain SEM and FIB equipment for high-resolution imaging and microstructure analysis.

• Perform complex TEM sample preparation using FIB to create ultra-thin, electron-transparent samples.

• Analyze and interpret SEM/FIB data, providing detailed insights into material structure, composition, and defects.

• Develop and refine methodologies to improve precision and efficiency.

• Collaborate with cross-functional teams to ensure alignment with project objectives.

What we’re looking for:

• Bachelor’s or Master’s degree in materials science, physics, or related field.

• Hands-on experience with SEM, FIB, and TEM sample preparation/analysis.

• Proficiency in image analysis software and data interpretation.

• Strong analytical skills, attention to detail, and a commitment to quality.

• Excellent communication and teamwork abilities.

Why join us?
You will be part of high-value research projects with a direct impact on innovation, product development, and quality improvement—working with advanced microscopy tools in a collaborative, forward-thinking environment.